Specifications
Family
Chroma 3380 / 3650 / 3680 ATE platform
Data Rate
Up to 1 Gbps
Digital I/O
Up to 2048 pins
Device Power Supplies
Up to 128 channels
Site Parallelism
Up to 2048
Software
Chroma CRISP integrated software platform (Windows, C++)
Data Output
STDF
RF Expansion
Upgrades to a complete RF chip test solution with the Chroma 35806
Positioning
VLSI digital device production test
Cooling
Air-cooled, compact footprint
Program Interface
C++ code-based editor with standard/user-defined templates
Migration
Test program and pattern converters from other platforms
Debug Tools
Plan Debugger, datalog, waveform, scope, SHMOO, pin margin
Wafer Support
Wafer map, summary, histogram and STDF result collection
Overview
The Chroma 3380 VLSI Test System is the digital ATE entry point of Chroma's 3380 / 3650 / 3680 platform. The platform scales to up to 2048 digital I/O pins, up to 1 Gbps data rate, up to 128 device power supply channels and up to 2048-site parallelism, with STDF data output for production traceability.
All three systems run Chroma's CRISP platform, which integrates test development, execution control, data analysis and tester management into a single Windows and C++ environment. Test programs auto-scale to multi-site parallel testing, and converters ease migration from other ATE platforms.
Existing 3380 owners can upgrade to a complete RF chip test solution by integrating the Chroma 35806 RFIC test set, with hardware and software comprehensively integrated.
Key Benefits
A single software platform across the digital ATE family. High digital pin count, 1 Gbps data rate, deep vector and pattern-instruction memory, and a documented upgrade path into mixed-signal and RF test without replacing the installed base.
Applications
VLSI digital device production test; multi-site wafer sort with wafer-map result collection; migration of legacy test programs onto a modern CRISP platform.
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