Specifications
Family
Chroma 3380 / 3650 / 3680 ATE platform
Data Rate
Up to 1 Gbps
Digital I/O
Up to 2048 pins
Device Power Supplies
Up to 128 channels
Site Parallelism
Up to 2048
Software
Chroma CRISP integrated software platform (Windows, C++)
Data Output
STDF
RF Expansion
Integrates with Chroma 35806 RFIC test set for RF chip test
Positioning
Advanced SoC and analog production test
Cooling
Air-cooled, compact footprint
Analog Options
ADDA, HDADDA, VI45, PVI100, MPVI, HVVI
Automation
Production OCI interface, setup tooling
Target Devices
High-pin-count SoC, MCU and mixed-signal devices
Overview
The Chroma 3680 Advanced SoC/Analog Test System is the high-pin-count member of Chroma's 3380 / 3650 / 3680 digital ATE family. The family shares a common platform that scales to up to 2048 digital I/O pins, up to 1 Gbps data rate, up to 128 device power supply channels and up to 2048-site parallelism.
Like the 3650, the 3680 runs Chroma's CRISP integrated software platform, which unifies test development, execution control, data analysis and tester management in a single Windows-based environment with a C++/GUI programming interface and STDF data output.
The 3680 integrates with the Chroma 35806 RFIC test set so a single production line can cover digital, analog, mixed-signal and RF device test.
Key Benefits
Platform scalability across device generations. High pin count with matched vector and pattern-instruction memory, per-pin PMU capability, a broad analog option set, and a software platform that lets test programs auto-scale to multi-site parallel testing.
Applications
High-pin-count SoC and MCU production test; analog and mixed-signal characterization; RF-enabled production lines paired with the Chroma 35806; wafer sort and final test.
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