Specifications
60-102B
7-slot LXI modular switching chassis (equivalent to 8-slot PXI)
60-103B
18-slot LXI modular switching chassis (equivalent to 19-slot PXI)
60-104
2-slot USB / LXI modular chassis, 5.9 kg
40-922A
8-slot PXI chassis (remote interface / embedded controller)
40-923A
19-slot PXI chassis (remote interface / embedded controller)
Backplane
64-bit cPCI/PXI, trigger and local-bus support
Module library
1,000+ PXI switching, instrumentation and simulation modules
Per-slot thermal
Up to 40 W per slot (60-102/60-103/60-104)
Matrix density
Up to 4,096 crosspoints in a 1U pizza-box matrix
Programmable resistors
Up to 36 channels (2x 18-ch modules in 60-104)
Control
LXI 1.4/1.5 Ethernet, USB3, or embedded PXI controller
Power (60-103B)
90-264 VAC, 47-63 Hz, 12 A @115 V / 6 A @230 V
Compliance
CE, RoHS, EN 61010-1, EN 61326-1
Operating temp
0 to +55 °C, 10-95% non-condensing
RF/microwave
Switching to 40 GHz / 65 GHz via RF multiplexer modules
Instrumentation
PSU, battery simulator, attenuators, DIO, relay drivers
Overview
Pickering Interfaces' PXI and LXI modular chassis turn the company's library of over 1,000 PXI switching and sensor-simulation modules into LXI-controllable instruments. The LXI family (60-102B 7-slot, 60-103B 18-slot, 60-104 2-slot USB/LXI) hosts 3U PXI modules over Gigabit Ethernet or USB3 with a driverless soft front panel, while the PXI chassis (40-922A 8-slot, 40-923A 19-slot) accept a remote interface or embedded controller.
Typical contents range from high-density matrices (up to 4,096 crosspoints) and RF/microwave switching to programmable resistors for temperature, strain and pressure sensor emulation, thermocouple simulators, battery simulators, attenuators, power supplies and digital I/O — the building blocks of automated test systems.
Key Benefits
One chassis hosts 1,000+ modules so test systems scale without re-architecture; LXI Ethernet / USB3 control enables distributed and remote ATE; 40 W per-slot thermal capacity supports high-density switching.
Applications
Semiconductor and electronics ATE; automotive and EV HIL test; aerospace/defense automated test; sensor simulation for ECU validation; RF/microwave switch systems; PXI-based functional test.
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