Specifications
Channels
1 or 2, fully isolated
Max Current Source / Measure
10 A pulse (3 A DC to 100 fA)
Max Voltage Source / Measure
40 V (2601B/2602B/2604B) · 200 V (2611B–2636B)
Lowest Current Range
100 pA with 0.1 fA resolution (2635B / 2636B)
Voltage Resolution
100 nV
Channel Power
30 W DC / 200 W pulse (30 V models) · 40 W DC / 200 W pulse (40 V models)
Basic Measure Accuracy
0.015% with 6½-digit resolution
Max Read Rate
20,000 readings/s into memory
Pulse Source
<100 µs width, 0.1% settled
TSP-Link Expansion
Up to 64 channels (32 SMUs) per system
Channel-to-Channel Sync
<500 ns
Embedded Scripting
TSP test-script processor (no PC bus overhead)
Interfaces
USB 2.0, LXI-C, GPIB, RS-232
Models
2601B, 2602B, 2604B, 2611B, 2612B, 2614B, 2634B, 2635B, 2636B
Protection Module
2600B-PM-1 200 V / 1 A clamp
List Price Range
US $11,900 – $30,500
Overview
The Keithley Series 2600B System SourceMeter instruments are the industry-standard current-voltage source and measure solution for highly automated production test. Each channel integrates a precision power supply, true current source, 6½-digit digital multimeter, arbitrary waveform generator, pulse generator and electronic load in a single half-rack instrument.
Dual-channel models place two completely isolated SMU channels in the same footprint, while TSP-Link expansion scales a system to 64 channels for SMU-per-pin parallel testing without a mainframe. The 2635B and 2636B reach 0.1 fA / 10⁻¹⁶ A resolution on the lowest 100 pA range for characterising very sensitive, low-current semiconductor devices such as VCSELs, photodiodes and sensor arrays.
Key Benefits
Industry-standard accuracy: 0.015% basic measurement accuracy with 6½-digit resolution across a 0.1 fA – 10 A and 100 nV – 200 V envelope. Scale without a mainframe: TSP-Link expands to 32 SMUs / 64 channels with <500 ns synchronisation. Faster production: embedded TSP scripting eliminates PC bus latency, and up to 20,000 readings/s into memory keeps up with high-throughput handlers. Flexible integration: USB, LXI-C, GPIB and RS-232 on the 2611B/2612B/2614B and 263x family.
Applications
Semiconductorparametric and wafer-level test, VCSEL and laser-diode characterisation, 3D-sensing emitter test, sensor and MEMS characterisation, battery and power-device test, and highly parallel SMU-per-pin production test.
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