Specifications

Function

Parameter analyzer — I-V, C-V, pulsed I-V

DC current-voltage range

10 aA to 1 A

DC voltage range

0.2 uV to 210 V

Capacitance-voltage range

1 kHz to 10 MHz, +-30 V DC bias

Pulsed I-V range

+-40 V (80 V p-p), +-800 mA

Pulse sampling

200 MSa/s, 5 ns sampling rate

SMU capacity

Up to 9 medium / high-power SMUs

PMU capacity

Up to 6 dual-channel PMUs

Ground unit

Built-in ground unit

Software

Clarius+ with 450+ application tests

Prober support

MPI, Cascade Microtech, Lucas Labs/Signatone, Wentworth

Cryogenic support

Lake Shore Model 336 temperature controller

Interfaces

USB 2.0/3.0, Ethernet, VGA, Serial, DisplayPort, HDMI

Storage

Solid-state drive for fast boot and data transfer

Mounting

Bench or rack mount

Overview

The Keithley 4200A-SCS is a fully integrated, configurable semiconductor parameter analyzer that synchronizes current-voltage, capacitance-voltage and ultra-fast pulsed I-V characterization in a single mainframe. It is the reference instrument for device, materials and process development where sub-femtoamp resolution and low-noise measurement matter.

A 4200A-SCS mainframe hosts up to nine medium or high-power source-measure units and up to six dual-channel pulse-measure units, so a single chassis can be configured from a two-terminal diode curve tracer up to a multi-terminal wafer-level characterization system. Clarius+ software ships more than 450 ready application tests and supports point-and-click test sequencing.

Key Benefits

Synchronized I-V/C-V/pulsed-I-V in one instrument. 10 aA resolution and 0.2 uV floors for advanced nodes. Full manual and semi-automated wafer-prober ecosystem support

Applications

Wafer-level device and materials characterization; reliability and failure analysis; process development; power-device and wide-bandgap evaluation; R&D labs, universities and foundry QA.

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